Sample inspection

Requirements：Negative dyeing, and frozen sample inspection

Process：Sample preparation，Transmission electron microscope upon inspection

From scratch

Requirements：Retreatment of freezen electron microscope

Process：Motion-corection,CTF estimation,Particle picking,2D classification,3D ab-initial,3D classification,3D refinement,High-resolution refinement

Other processing requirements

Requirements：Improved resolution，Flexible area，Local refinement

Process：Data evalution,Motion-correction,CTF estimation,Particle picking,,2D classification,3D ab-initial,3D classification,3D refinement,High-resolution refinement